Archives for May 29, 2008

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Rigaku introduces first benchtop WD-XRF spectrometer

The world's first high-powered benchtop wavelength dispersive XRF spectrometer has been introduced as high-precision analysis at low concentration levels is now available to laboratories and research institutions.

Olympus introduces see-through silicon microscope

Microscopy giants Olympus have added a confocal laser scanning microscope to its ever expanding range packing this latest model with a 1310 nm laser that can image components encased within a silicon shell.

Canada to tighten up biosecurity laws with new bill

Canada has bought its laboratory legislation in line with other international standards as the country proposes new legislation designed to tighten safety and access to human pathogens and toxins.