Jasco launches V-7000 series spectrophotometers
improved spectral resolution, resolving peaks of less than 0.5 nm.
The advance in clarity makes this technology suitable for
applications from 175-3300nm.
Spectrophotometry is used extensively in many areas of science including colorimetry science, ink manufacturers, printing companies, textiles vendors as well as drug research and development. Spectrometry usually involves taking readings every 10 nanometers along the visible region producing a spectral reflectance curve.
These curves can be used to test a new batch of colorant to check if it makes a match to specifications. Traditional visual region spectrophotometers cannot detect if a colorant has fluorecence. This can make it impossible to manage colour issues if one or more of the printing inks is fluorescent. Where a colorant contains fluorescence, a bi-spectral fluorescent spectrophotometer is used.
The systems incorporate a floating casting system that isolates the optics from vibrational and atmospheric interferences, providing low spectrophotometer noise. They are also capable of fast scans (2000 nm/min) with no wavelength shifts.
The new Jasco V-7000 Series UV-VIS-NIR Spectrophotometers are available in three models with wavelength ranges available to suit the application. The Jasco V-7100 offers photometric performance from 175-900 nm, while the new Jasco V-7200 incorporates a PbS detector to extend the wavelength range through the NIR to 3300 nm.
The V-7300 features an InGaAs detector, which provides reduced noise and enhanced sensitivity in the NIR range. This results in improved detection limits and increased scan rates to obtain a cleaner spectrum with better resolution in less time. With an operating range of 175-1800 nm, the V-7300 offers the evaluation development of photonics and communications technologies.
All models in the V-7000 systems are compatible with the >Jasco Absolute Reflectance Measurement System, which automates the measurement of the spectral properties, film thickness, angle variation or other characteristics of solid samples such as semiconductors, thin films, and various optical elements.
The measurement system enables measurements of challenging samples with reduced noise and photometric stability. The incidence and collection angles can be set in a synchronous mode, simultaneously rotating the sample stage and integrating sphere.
Alternatively, the incidence and collection angles can be individually declared in an asynchronous mode. The polarisation properties of a sample can also be examined using P or S polarisation or by setting the desired polarisation angles.
This series, when coupled with Jasco's Spectra Manager software, makes the system easy to use for a variety of applications.